ALLEN, Ryan; YE, Ying. Why Deteriorating Relations, Xenophobia, and Safety Concerns Will Deter Chinese International Student Mobility to the United States. Journal of International Students, [S. l.], v. 11, n. 2, p. i-vii, 2021. DOI: 10.32674/jis.v11i2.3731. Disponível em: https://ojed.org/jis/article/view/3731. Acesso em: 29 may. 2025.